JM Vistec System
Booth No. 7A02
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5MP SWIR Microscopic System
The 5MP high resolution ensures that the camera combined with the microscope system, this equipment achieves precise observation of the microcosmic world. The high-magnification function of the microscope perfectly integrates with the high resolution and infrared detection capability of the camera, allowing inspectors to clearly observe various problems on the wafer such as scratches, particle contamination, and pattern defects.