Advanced Semiconductor Inspection Microscope
Our advanced semiconductor inspection microscope is a state-of-the-art, high-end device designed for precise detection. It features a large NA value, ensuring high-resolution imaging that captures minute details clearly. The large field of view, combined with a 65-million-pixel industrial camera, provides ultra-high-definition images, meeting complex inspection requirements. Multiple magnification options of objectives and tube lenses offer flexible solutions for various detection tasks with different sizes and precision needs. The microscope also supports various illumination methods, including brightfield, darkfield, and fluorescence, to accurately reveal sample features. Additionally, it supports dual-camera configuration, further enhancing detection efficiency and flexibility. With these premium features, it leads the field of semiconductor inspection and is a reliable partner for your detection needs.