Pansin Automation newly launched the infrared light source LS300N, specially designed for photovoltaic detection applications, with high-quality image acquisition capability. It supports customized infrared light of any wavelength from 365nm to 1300nm, compatible with various infrared sensitive devices, and can obtain clear images even in low light or dark environments, improving the efficiency and accuracy of crack detection.
Equipped with high-power LED beads, the strong and uniform illumination effect meets the high brightness demand of silicon wafer crack detection. The unique focusing column design ensures that the light is focused and effectively reduces energy consumption. Using high-density heat sink, it effectively controls the operating temperature of the light source, ensures the stability and reliability of continuous operation, and extends the service life of the equipment.