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Defect Inspection Systemfor Glass Wafer(NOVA-2000-G)
Defect Inspection Systemfor LN/LT Wafer
Defect Inspection Systemfor Patterned Wafer(AMMI-2000)
Automated Defect Inspection System for Lenses Model: AOSI-4000S
Defect Inspection System for Sic(NOVA-2000)
Laser Confocal Microscope Model: LCM-2000